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About This Item
Empirical Formula (Hill Notation):
C42H28
CAS Number:
Molecular Weight:
532.67
UNSPSC Code:
12352103
NACRES:
NA.23
PubChem Substance ID:
EC Number:
208-242-0
Beilstein/REAXYS Number:
1917339
MDL number:
Quality Level
assay
≥98%
mp
330-335 °C (lit.)
λmax
460 nm (2nd)
SMILES string
c1ccc(cc1)-c2c3ccccc3c(-c4ccccc4)c5c(-c6ccccc6)c7ccccc7c(-c8ccccc8)c25
InChI
1S/C42H28/c1-5-17-29(18-6-1)37-33-25-13-14-26-34(33)39(31-21-9-3-10-22-31)42-40(32-23-11-4-12-24-32)36-28-16-15-27-35(36)38(41(37)42)30-19-7-2-8-20-30/h1-28H
InChI key
YYMBJDOZVAITBP-UHFFFAOYSA-N
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General description
Rubrene is a tetraphenyl derivative of tetracene that is used as an organic semiconductor. It is used as a source material in the fabrication of rubrene single crystal based transistors with carrier mobility over 10 cm2V−1s−1.
Application
Rubrene based thin films are used as semiconducting layers along with poly(vinylidene fluoride-terefluoroethylene) (PVDF-TeFE) as insulating layers for the fabrication of ferro-electric gate field effect transistors (FETs). It may also be used as high mobility transporting material in the development of single crystal FETs.
Reagent for chemiluminescence research and for transition metal complex ligation.
Storage Class
11 - Combustible Solids
wgk
WGK 3
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
Eyeshields, Gloves, type N95 (US)
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High performance of rubrene thin film transistor by weak epitaxy growth method
Chang H, et al.
Organic Electronics, 20, 43-48 (2015)
Field-effect transistors on rubrene single crystals with parylene gate insulator
Podzorov V, et al.
Applied Physics Letters, 82(11), 1739-1741 (2003)
Organic ferroelectric gate field-effect transistor memory using high-mobility rubrene thin film
Kanashima T, et al.
Japanese Journal of Applied Physics, 53(4S), 04ED11-04ED11 (2014)
Intrinsic charge transport on the surface of organic semiconductors
Podzorov V, et al.
Physical Review Letters, 93(8), 086602-086602 (2004)
Influence of the gate dielectric on the mobility of rubrene single-crystal field-effect transistors
Stassen AF, et al.
Applied Physics Letters, 85(17), 3899-3901 (2004)
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